AMMRF -

Dualbeam FIB/FESEM (Uni Adelaide)

Contact: Dr Len Green, Dualbeam Engineer, Tel: 08 8303 5855
 
South Australian Regional Facility Nodes

Example images
Nanofabrication.
Image courtesy of FEI Company.

Capabilities

The next-generation focused ion beam / field-emission SEM instrument provides a platform for sub-nanometre resolution imaging with innovative machining capability. The instrument provides leading-edge capability with novel solutions to difficult sample preparation, 2-D and 3-D nanoanalysis and prototyping, and it adds to the nations capacity for this technology.

Applications include micro-machining and analysis of renewable energy 'sliver' technologies, applications for the defence industries, and in the prototype manufacture of laser hydrophones.

TOP
Flagship instruments

Cameca NanoSIMS 50 (UWA)

FEI Tecnai F30 High-Throughput CryoTEM (UQ)

Imago Local Electrode Atom Probe & Wide-Field-Of-View Laser Atom Probe (USYD)

FEI Nova Nanolab 200 Dualbeam FIB (UNSW)

Dualbeam FIB/FESEM (Uni Adel)

Coming on-line:

Time-Of-Flight Secondary Ion Mass Spectrometer (Uni SA)

Cameca 1280 Large-Radius Ion Microprobe (UWA)

High-Resolution SEM Analysis Facility (UNSW)