Preparation of TEM specimen on interface between electrode and electrolyte in a fuel cell, resulting in an ultrathin section across electrode/electrolyte interface.

Advanced microscopy platform comprising high-performance electron and ion columns and analytical detectors for use in 2D and 3D microscopy, materials modification and fabrication of insulators, metals and semiconducting materials.

• Implantation and nano-machining
• Quantum Dots and arrays
• Precise Surface Reconstructions
• Select chemically regions for machining
• Alternate between imaging and nanomilling
• Single atom implantation, device prototyping or selective alloying

• Nanoscale metrology: characterisation of micro devices (e.g.) recording heads, quantum computer, photonics, semiconductors
• Engineering materials: new insights

• Dual-beam, featuring a scanning electron microscope
• Focussed Ga source for ion machining and milling
• Multi-source
  
• Analytical capability (EDXS, EBSD)
• Ion energy range: 5 – 30 keV
• Ion beam current range: 1 pA to 20 nA
• Ion beam min. diameter: approx. 10 nm
• Electron column energy range: 0.5 – 30 keV
• Electron column imaging resolution: 1 nm