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Glossary terms about Ion

Ion
An atom, or group of atoms, that has lost one or more electrons making it positively charged (a cation) or gained one or more electrons making it negatively charged (an anion).

▼25 more terms contain Ion



28 pages mention Ion

Accuracy, Precision and Detection Limits
It depends on the standards used and the spectral processing and corrections applied to the raw data. 
Additional material
Microscopy & Microanalysis 12, 2–25. 2006. Newbury D. Find Analytichem - The revolution in Energy Dispersive X-Ray Spectrometry: spectrum imaging at output count rates above 1MHz with the silicon drift detector on the scanning electron microscope. 
Auger animation
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Background information - What is energy dispersive X-ray spectroscopy?
Energy Dispersive X-ray Spectroscopy (EDS, EDX or XEDS) is a qualitative and quantitative X-ray microanalytical technique that can provide information on the chemical composition of a sample for elements with atomic number (Z) >3. 
Bremsstrahlung animation
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Bremsstrahlung X-ray generation
Two types of X-rays are produced by interaction of the electron beam with the sample in both the SEM and TEM: Bremsstrahlung (which means ‘braking radiation’) and Characteristic X-rays. 
Characteristic X-ray generation
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Characteristic X-rays
The K shell has the highest ionization energy or critical ionization energy in the atom. 
EDS spectral artifacts
Improvements in design and construction of semiconductor detectors has minimized these artifacts, but they may be present in older detectors. 
EDS spectral resolution
A Characteristic X-ray peak in an ED spectrum has a spectral resolution that is related to the width of the Gaussian peak and is a function of the detector that was used to collect the spectrum, and its electronics. 
Generation of X-rays in the Electron Microscope
In the scanning electron microscope (SEM), the electrons from the primary beam spread out in the sample to form the interaction volume. 
Introduction
This module will provide you with background information and practical advice for the successful operation of a range of microanalytical methods, with emphasis on techniques that are commonly hosted on SEMs and TEMs. 
K-lines animation
Click the buttons to show each peak. Show CShow SShow Ca The Kα X-ray peak for carbon (Z=6)  
KL-lines animation
Click the buttons to show each peak. Show ScShow Zn For scandium (Z=21) the Kα and Kβ peaks are resolved and L-family peaks are visible at low energy. 
L-lines animation
Click the buttons to show each peak. Show RbShow TcShow Sb For rubidium (Z=37) the Ll peak can be seen on the low-energy side of the main L-family peak. 
M-lines animation
Click the buttons to show each peak. Show HfShow PbShow U For hafnium (Z=72) the Mζ peak (low energy) and Mγ peak (high energy) can be seen on either side of the main M family peak. 
Operational example - area and map analysis - stainless steel
 
Operational example - point analysis - stainless steel
 
Operational example - project setup - stainless steel
 
Qualitative EDS X-ray microanalysis using SEM and TEM
While commercial peak-identification software is improving all the time, it is not yet 100% accurate. 
Quantitative EDS X-ray microanalysis using SEM
In quantitative EDS microanalysis in SEM, the mass fractions or weight percents of the elements present in the sample are calculated. 
Reference standard
 
The photoelectric effect
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Virtual area analysis with mapping - granite
 
Virtual point analysis - granite
 
X-ray detection by EDS
Other detection systems, e. 
X-ray intensity
It is tempting to assume that the height of the X-ray peak in the spectrum will be proportional to the concentration of the element in the sample. 
X-Ray mapping
X-ray mapping provides images of elemental distributions in a sample.