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Glossary terms about Atomic Force Microscopy

Atomic Force Microscopy (AFM)
One of the scanning probe microscopes. This approach measures the force between a sharp probe and the sample. Many types of forces can be measured.


6 pages mention Atomic Force Microscopy

AFM calibration methods
A., et al. Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration. 
AFM imaging of surfaces
Journal Link... Bellucci, S., Gaggiotti, G., et al. atomic force microscopy Characterization of Carbon Nanotubes. 
AFM probe modification
C., Raman, A. Identification of multiple oscillation states of carbon nanotube tipped cantilevers interacting with surfaces in dynamic atomic force microscopy
Force distance spectroscopy
Journal Link... Cappella, B., Dietler, G. Force-distance curves by atomic force microscopy
Review articles
Journal Link... Cappella, B., Dietler, G. Force-distance curves by atomic force microscopy
Techniques
There are many varieties of scanning probe microscope (SPM) techniques ranging from the most common which are atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), to more specialised instruments such as the near-field scanning optical microscope (NSOM/SNOM), tip-enhanced Raman microscope (TERS), and lateral force microscope (LFM) among others.