training for advanced research


Glossary terms about Scanning

The act of moving the probe over the sample to collect an image.

▼1 more term contains Scanning

24 pages mention Scanning

AFM calibration methods
S. scanning force microscopy - Calibrative procedures for 'best practice'. 
AFM imaging of surfaces
Journal Link... Pandey, D., Reifenberger, R., et al. scanning probe microscopy study of exfoliated oxidized graphene sheets. 
AFM papers
L., et al. Recent Advances in Atomic-Force Microscopy of DNA. scanning 15(5): 296-299, 1993. 
AFM probe modification
L., et al. High-yield assembly of individual single-walled carbon nanotube tips for scanning probe microscopes Journal of Physical Chemistry B 105 (4): 743-746, 2001. 
AFM: Background information
The Atomic Force Microscope (AFM) operates by scanning an AFM probe across a sample surface. 
Cantilever tuning - only for tapping and non-contact modes
The resonant frequency of the cantilever can then be found by scanning through a range of frequencies and monitoring the amplitude of oscillation of the cantilever on the photodiode. 
Contact mode
Contact mode/ constant force AFM operates by scanning the tip across the sample surface while monitoring the change in cantilever deflection with a split photodiode detector. 
How is the Data Displayed?
Most scanning Probe experiments produce data as a function of the sample's x and y position. 
Image Scanning and feedback parameter optimisation - scan rate
scanning too fast will mean the tip will not track or trace the surface effectively and result in scan artefacts such as those depicted in Figure 19. 
Rohrer, from IBM research laboratories, invented a new type of microscope called a scanning tunnelling microscope (STM). 
Laser alignment on cantilever
If not performed properly then a number of artefacts can result including, for example, excessive force being applied to the surface when scanning and optical interference fringes from reflective surfaces can be detected. 
Near-field scanning optical microscope (NSOM/SNOM)
Review articles
S., et al. scanning force microscopy - Calibrative procedures for 'best practice'. 
Scanner artefacts
Hysteresis can be reduced or eliminated by re-starting the scan, and/or scanning more slowly. 
Scanning probe microscopy in practice
Scanning Tunneling Microscopy (STM)
STM is the oldest of the scanning probe microscopes and involves bringing an atomically sharp tip within a couple of nanometres of the sample. 
Set-point - contact mode
Optimise set-point Optimise  
Specimen choice
For sample scanning systems sample size is also typically restricted to a maximum area of 1x1 cm and with a maximum sample thickness of approximately 3 mm. 
Tapping mode
Tapping Mode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface. 
There are many varieties of scanning probe microscope (SPM) techniques ranging from the most common which are atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), to more specialised instruments such as the near-field scanning optical microscope (NSOM/SNOM), tip-enhanced Raman microscope (TERS), and lateral force microscope (LFM) among others. 
Tip artefacts
Artefacts result from the tip either becoming contaminated by material on the sample surface or from wear due to scanning
Virtual Scanning probe microscopy
Please select which sample you would like to view under the scanning probe microscope. 
Virtual SPM - Calibration grid
Interactive simulation of a scanning probe microscope. 
Virtual SPM - Nanotubes
Interactive simulation of a scanning probe microscope.