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Glossary terms about Scanning Tunnelling Microscope

Scanning Tunnelling Microscope (STM)
One of the scanning probe microscopes. This approach measures the tunnelling current between an atomically sharp tip and the sample and is routinely capable of atomic resolution.

18 pages mention Scanning Tunnelling Microscope

AFM calibration methods
AFM imaging of surfaces
AFM imaging: Interactions between the probe and sample
AFM papers
AFM probe modification
AFM: Background information
Contact mode
Force distance spectroscopy
Image artefacts
Image Scanning and feedback parameter optimisation - scan rate
Rohrer, from IBM research laboratories, invented a new type of microscope called a scanning tunnelling microscope (STM). 
Measuring forces in the tip-sample space
Review articles
Scanner artefacts
Scanning Tunneling Microscopy (STM)
Specimen choice
Tapping mode