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Glossary terms about Scanning Tunnelling Microscope

Scanning Tunnelling Microscope (STM)
One of the scanning probe microscopes. This approach measures the tunnelling current between an atomically sharp tip and the sample and is routinely capable of atomic resolution.


18 pages mention Scanning Tunnelling Microscope

AFM calibration methods
 
AFM imaging of surfaces
 
AFM imaging: Interactions between the probe and sample
 
AFM papers
 
AFM probe modification
 
AFM: Background information
 
Contact mode
 
Discontinuous
 
Force distance spectroscopy
 
Image artefacts
 
Image Scanning and feedback parameter optimisation - scan rate
 
Introduction
Rohrer, from IBM research laboratories, invented a new type of microscope called a scanning tunnelling microscope (STM). 
Measuring forces in the tip-sample space
 
Review articles
 
Scanner artefacts
 
Scanning Tunneling Microscopy (STM)
 
Specimen choice
 
Tapping mode