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Glossary terms about Current

Current
Measured flow of electrons between the STM tip and the sample.


26 pages mention Current

AFM calibration methods
 
AFM imaging of surfaces
 
AFM papers
 
AFM probe modification
 
Cantilever tuning - only for tapping and non-contact modes
 
Composite control (PID)
 
Contact and tapping modes
 
Contact mode
 
Derivative control
 
Discontinuous
 
Floating control
 
Force distance spectroscopy
 
How is the Data Displayed?
This data can range from tunneling current, to force between sample and tip, to height to reach a certain force etc. 
Image artefacts
For the smallest diameter probes, silicon is currently the material of choice. 
Image Scanning and feedback parameter optimisation - scan rate
 
Integral control
 
Introduction
If this vacuum barrier is approximately a few atomic diameters thick, electrons are able to tunnel through it, and a current will flow. 
Measuring forces in the tip-sample space
 
Non-contact mode
 
Proportional control (P)
 
Review articles
 
Scanner artefacts
 
Scanning Tunneling Microscopy (STM)
When a bias is applied between the tip and sample, electrons will tunnel from the one to the other and this current can be used to measure the topography of the sample. 
Set-point - contact mode
 
Tailor this module
 
Virtual SPM - Nanotubes