Images from electrons
Electron images from the SEM can be used to achieve different information, for example for topographical, morphological, compositional, or crystallographical studies. There are a range of imaging techniques available.
Image from secondary electrons (below lens SE detector)
Zincite (ZnO) powder and tabular crytals of shigate (Mn7AL4(SO4)2(OH)228H2O) showing crystal shape and size.
(Topographical and morphological information: texture, shape and size.)
Image from secondary electrons: high-resolution (InLens SE detector)
(Topographical and morphological information.)
Image from backscattered electrons
Mineral sand: lighter grains have higher average atomic number.
Image using panchromatic cathodoluminescence (CL)
Zircon, showing crystal growth patterns.
(Information on composition, defects, and impurities.)
X-ray element distribution map
Aluminium, calcium and iron ooids.
Electron Backscatter Diffraction (EBSD) map
An orientation map of a quartz clast in a pseudotachylite (earthquake rock) showing recrystallisation around the outer edge.
An electron backscatter diffraction pattern (EBSP)
EBSP from a quasicrystalline AlMnSi inclusion in an aluminium alloy.
An orientation (channelling) contrast image
A duplex steel sample, collected using forescatter detectors mounted on an EBSD detector.