List of available techniques
- Atom probe tomography (APT)
- Atomic force microscopy (AFM)
- Auger electron spectroscopy (AES)
- Bioluminescent/fluorescent imaging
- Cathodoluminescence (CL)
- Correlative microscopy (CM)
- Cryo scanning electron microscopy (cryo-SEM)
- DLS particle sizing
- E-beam lithography (EBL)
- EFTEM
- Electron backscatter diffraction (EBSD)
- Electron probe microanalysis (EPMA)
- Electron tomography and single particle analysis (SPA)
- Ellipsometry
- Environmental (ESEM) and low vacuum scanning electron microscopy (LVSEM)
- Field ion microscopy (FIM)
- Flow cytometry and cell sorting (FACS)
- Fluorescence correlation spectroscopy (FSC) and raster image correlation spectroscopy (RICS)
- Fluorescence lifetime imaging microscopy (FLIM)
- Fluorescence recovery after photobleaching (FRAP)
- Fluorescence resonance energy transfer (FRET)
- Fluorescence, confocal and related techniques
- Focused ion beam (FIB) technology
- Fourier transform infrared spectroscopy (FTIR)
- Infrared mass spectroscopy (IRMS)
- Ionisation mass spectrometry (IMS)
- Laser ablation inductively coupled plasma mass spectrometry (LAICPMS)
- Laser microdissection (LMD)
- Light microscopy – reflectance
- Light microscopy – transmitted light
- Live-cell imaging
- Metastable induced electron spectroscopy (MIES)
- Mineral liberation analysis (MLA)
- Nano secondary ion mass spectrometry (NanoSIMS)
- Near-field scanning microscopy (NSOM)
- Nuclear magnetic resonance (NMR)
- Optical waveguide lightmode spectrocopy (OWLS)
- Raman
- Scanning electron microscopy (SEM) – imaging
- Scanning electron microscopy (SEM) – in-situ techniques
- Scanning electron microscopy (SEM) – spectroscopy
- Scanning transmission electron microscopy (STEM)
- Scanning tunnelling microscopy (STM)
- Secondary ion mass spectroscopy (SIMS)
- Small-angle X-ray scattering (SAXS)
- Solution ICPMS
- Surface plasmon resonance (SPR)
- Surface profiling
- Thermal analysis
- Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
- Total internal reflection fluorescence microscopy (TIRF)
- Transmission electron microscopy (TEM) – diffraction
- Transmission electron microscopy (TEM) – imaging
- Transmission electron microscopy (TEM) – in-situ techniques
- Transmission electron microscopy (TEM) – spectroscopy
- X-ray diffraction (XRD)
- X-ray fluorescence (XRF)
- X-ray microtomography (micro-CT)
- X-ray nanotomography (nano-CT)
- X-ray photoelectron spectroscopy (XPS)
- X-ray reflectivity