AMMRF -

Time-Of-Flight Secondary Ion Mass Spectrometer (Uni SA),
scheduled March 2009

Contact: Prof. Hans Griesser, Director SARF Node, Tel: 08 8302 3703.
   
South Australian Regional Facility Nodes

Example images
 

ToF-SIMS imaging of a diagnostic microarray surface.

 

   
 

Part of the mass spectrum recorded with a sub-monolayer antibacterial coating.

Capabilities

A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences.

Benefits :

  • Mass spectra of surface layers of materials and absorbed molecules.
  • Imaging of spatial distributions of mass signals on materials surfaces.

Inside Physical Electronics TRIFT II ToFSIMS chamber.
Image courtesy of National Institute of Biomedical Imaging and Bioengineering.

TOP
Flagship instruments

Cameca NanoSIMS 50 (UWA)

FEI Tecnai F30 High-Throughput CryoTEM (UQ)

Imago Local Electrode Atom Probe & Wide-Field-Of-View Laser Atom Probe (USYD)

FEI Nova Nanolab 200 Dualbeam FIB (UNSW)

Dualbeam FIB/FESEM (Uni Adel)

Coming on-line:

Time-Of-Flight Secondary Ion Mass Spectrometer (Uni SA)

Cameca 1280 Large-Radius Ion Microprobe (UWA)

High-Resolution SEM Analysis Facility (UNSW)