Time-Of-Flight Secondary Ion Mass Spectrometer (Uni SA),
scheduled March 2009
Contact: Prof. Hans Griesser, Director SARF Node, Tel: 08 8302 3703.

Example images
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ToF-SIMS imaging of a diagnostic microarray surface.
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Part of the mass spectrum recorded with a sub-monolayer antibacterial coating. |
Capabilities
A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences. Benefits :
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Inside Physical Electronics TRIFT II ToFSIMS chamber. |








